JPS6238032Y2 - - Google Patents

Info

Publication number
JPS6238032Y2
JPS6238032Y2 JP4946481U JP4946481U JPS6238032Y2 JP S6238032 Y2 JPS6238032 Y2 JP S6238032Y2 JP 4946481 U JP4946481 U JP 4946481U JP 4946481 U JP4946481 U JP 4946481U JP S6238032 Y2 JPS6238032 Y2 JP S6238032Y2
Authority
JP
Japan
Prior art keywords
slide pin
rotor
caliper
pin
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4946481U
Other languages
English (en)
Japanese (ja)
Other versions
JPS57163035U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4946481U priority Critical patent/JPS6238032Y2/ja
Publication of JPS57163035U publication Critical patent/JPS57163035U/ja
Application granted granted Critical
Publication of JPS6238032Y2 publication Critical patent/JPS6238032Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Braking Arrangements (AREA)
JP4946481U 1981-04-06 1981-04-06 Expired JPS6238032Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4946481U JPS6238032Y2 (en]) 1981-04-06 1981-04-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4946481U JPS6238032Y2 (en]) 1981-04-06 1981-04-06

Publications (2)

Publication Number Publication Date
JPS57163035U JPS57163035U (en]) 1982-10-14
JPS6238032Y2 true JPS6238032Y2 (en]) 1987-09-29

Family

ID=29846189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4946481U Expired JPS6238032Y2 (en]) 1981-04-06 1981-04-06

Country Status (1)

Country Link
JP (1) JPS6238032Y2 (en])

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0312976Y2 (en]) * 1987-02-19 1991-03-26
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US6970634B2 (en) 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US6815963B2 (en) 2002-05-23 2004-11-09 Cascade Microtech, Inc. Probe for testing a device under test
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE202005021386U1 (de) 2004-07-07 2007-11-29 Cascade Microtech, Inc., Beaverton Prüfkopf mit einem Messfühler mit Membranaufhängung
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
JP2006207768A (ja) * 2005-01-31 2006-08-10 Kayaba Ind Co Ltd シールチェック機能を備えた接続構造
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
WO2006137979A2 (en) 2005-06-13 2006-12-28 Cascade Microtech, Inc. Wideband active-passive differential signal probe
WO2007146285A2 (en) 2006-06-09 2007-12-21 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus

Also Published As

Publication number Publication date
JPS57163035U (en]) 1982-10-14

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